Statistics and noise in a quantum measurement process

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dc.creatorMakhlin, Yuriy
dc.creatorSchoen, Gerd
dc.creatorShnirman, Alexander
dc.date2000-01-28
dc.date.accessioned2026-07-07T02:36:39Z
dc.date.available2026-07-07T02:36:39Z
dc.descriptionThe quantum measurement process by a single-electron transistor or a quantum point contact coupled to a quantum bit is studied. We find a unified description of the statistics of the monitored quantity, the current, in the regime of strong measurement and expect this description to apply for a wide class of quantum measurements. We derive the probability distributions for the current and charge in different stages of the process. In the parameter regime of the strong measurement the current develops a telegraph-noise behavior which can be detected in the noise spectrum.
dc.description4 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0001423
dc.identifierhttp://arxiv.org/abs/cond-mat/0001423
dc.identifierPhys. Rev. Lett. 85, 4578-4581 (2000)
dc.identifierdoi:10.1103/PhysRevLett.85.4578
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/16002
dc.subjectMesoscale and Nanoscale Physics
dc.subjectSuperconductivity
dc.subjectQuantum Physics
dc.titleStatistics and noise in a quantum measurement process
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