Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale

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Dynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and hysteresis-free translation in the 0.05-20 nm range. The voltage-activated motion is described by a coefficient of 0.03 \pm 0.005 nm/V.
6 pages, 5 figures

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Instrumentation and Detectors, Atomic Physics

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http://salesiana.dossiersoluciones.com/handle/123456789/116821

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/physics/0608093
 http://arxiv.org/abs/physics/0608093

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arXiv