Dynamic phase microscopy: measurements of translational displacements at sub-nanometer scale

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dc.creatorTichinsky, V. P.
dc.creatorKretushev, A. V.
dc.creatorLuskinovich, P. N.
dc.date2006-08-08
dc.date.accessioned2026-07-07T07:25:44Z
dc.date.available2026-07-07T07:25:44Z
dc.descriptionDynamic phase microscopy has been applied for measurements of nanometer-scale displacements of a piezoelectric scanner. This scanner, which was designed for calibration purposes for scanning probe microscopy and TEM, exhibited a linear and hysteresis-free translation in the 0.05-20 nm range. The voltage-activated motion is described by a coefficient of 0.03 \pm 0.005 nm/V.
dc.description6 pages, 5 figures
dc.identifierhttps://arxiv.org/abs/physics/0608093
dc.identifierhttp://arxiv.org/abs/physics/0608093
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/116821
dc.subjectInstrumentation and Detectors
dc.subjectAtomic Physics
dc.titleDynamic phase microscopy: measurements of translational displacements at sub-nanometer scale
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