Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO3 on SrTiO3

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High quality epitaxial thin-films of EuTiO3 have been grown on the (001) surface of SrTiO3 using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two-dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail using ex situ x-ray diffraction. The thicnkess and composition were confirmed with Rutherford Backscattering. The EuTiO3 films grow two-dimensionally, epitaxially, pseudomorphically, with no measurable in-plane lattice mismatch.
7 pages, 6 figures

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/23997

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/cond-mat/0405423
 http://arxiv.org/abs/cond-mat/0405423
 Journal of Applied Physics, vol. 96, issue 9, pages 5324-5328, 2004
 doi:10.1063/1.1794362

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arXiv