Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO3 on SrTiO3

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dc.creatorWang, Huan-Hua
dc.creatorFleet, Aaron
dc.creatorDale, Darren
dc.creatorSuzuki, Yuri
dc.creatorBrock, J. D.
dc.date2004-05-18
dc.date.accessioned2026-07-07T02:58:14Z
dc.date.available2026-07-07T02:58:14Z
dc.descriptionHigh quality epitaxial thin-films of EuTiO3 have been grown on the (001) surface of SrTiO3 using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two-dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail using ex situ x-ray diffraction. The thicnkess and composition were confirmed with Rutherford Backscattering. The EuTiO3 films grow two-dimensionally, epitaxially, pseudomorphically, with no measurable in-plane lattice mismatch.
dc.description7 pages, 6 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0405423
dc.identifierhttp://arxiv.org/abs/cond-mat/0405423
dc.identifierJournal of Applied Physics, vol. 96, issue 9, pages 5324-5328, 2004
dc.identifierdoi:10.1063/1.1794362
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23997
dc.subjectMaterials Science
dc.titleNearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO3 on SrTiO3
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