Measurements of Luminescence from Cleaved Silicon

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This paper outlines the results from experiments performed to gain further information about the structure and properties of cleaved silicon surfaces, using vacuum cleavage luminescence detection methods. The experiments involved detecting the luminescence produced by cleaving thin silicon plates within a high vacuum, by a process of converting the luminescence to an amplified electrical signal.
Submitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/136048

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/0708.1847
 http://arxiv.org/abs/0708.1847
 Dans European Nano Systems Worshop - ENS 2005, Paris : France (2005)

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arXiv