Measurements of Luminescence from Cleaved Silicon

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dc.creatorLi, Dongguang
dc.date2007-08-14
dc.date.accessioned2026-07-07T08:23:35Z
dc.date.available2026-07-07T08:23:35Z
dc.descriptionThis paper outlines the results from experiments performed to gain further information about the structure and properties of cleaved silicon surfaces, using vacuum cleavage luminescence detection methods. The experiments involved detecting the luminescence produced by cleaving thin silicon plates within a high vacuum, by a process of converting the luminescence to an amplified electrical signal.
dc.descriptionSubmitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)
dc.identifierhttps://arxiv.org/abs/0708.1847
dc.identifierhttp://arxiv.org/abs/0708.1847
dc.identifierDans European Nano Systems Worshop - ENS 2005, Paris : France (2005)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/136048
dc.subjectMaterials Science
dc.titleMeasurements of Luminescence from Cleaved Silicon
dc.typetext

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