The Role of Reconstructed Surfaces in the Intrinsic Dissipative Dynamics of Silicon Nanoresonators
| dc.creator | Chu, M. | |
| dc.creator | Rudd, R. E. | |
| dc.creator | Blencowe, M. P. | |
| dc.date | 2007-04-30 | |
| dc.date.accessioned | 2026-07-07T07:58:53Z | |
| dc.date.available | 2026-07-07T07:58:53Z | |
| dc.description | Dissipation in the flexural dynamics of doubly clamped nanomechanical bar resonators is investigated using molecular dynamics simulation. The dependence of the quality factor Q on temperature and the size of the resonator is calculated from direct simulation of the oscillation of a series of Si <001> bars with bare {100} dimerized surfaces. The bar widths range from 3.3 to 8.7nm, all with a fixed length of 22nm. The fundamental mode frequencies range from 40 to 90GHz and Q from 10^2 near 1000K to 10^4 near 50K. The quality factor is shown to be limited by defects in the reconstructed surface. | |
| dc.description | 4 pages, 5 figures | |
| dc.identifier | https://arxiv.org/abs/0705.0015 | |
| dc.identifier | http://arxiv.org/abs/0705.0015 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/128169 | |
| dc.subject | Materials Science | |
| dc.title | The Role of Reconstructed Surfaces in the Intrinsic Dissipative Dynamics of Silicon Nanoresonators | |
| dc.type | text |