Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis

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We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the $K$ edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma {\it et al}. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra.
18 pages, 11 figures

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/100121

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/cond-mat/0405009
 http://arxiv.org/abs/cond-mat/0405009
 J. Phys. Soc. Jpn. 73, 3171-3176(2004)
 doi:10.1143/JPSJ.73.3171

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arXiv