Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis
| dc.creator | Nisikawa, Yunori | |
| dc.creator | Usuda, Manabu | |
| dc.creator | Igarashi, Jun-ichi | |
| dc.date | 2004-05-01 | |
| dc.date | 2006-04-18 | |
| dc.date.accessioned | 2026-07-07T06:36:34Z | |
| dc.date.available | 2026-07-07T06:36:34Z | |
| dc.description | We investigate theoretically the resonant inelastic x-ray scattering (RIXS) at the $K$ edge of Si on the basis of an ab initio calculation. We calculate the RIXS spectra with systematically varying transfered-momenta, incident-photon energy and incident-photon polarization. We confirm the anisotropy of the experimental spectra by Y. Ma {\it et al}. (Phys. Rev. Lett. 74, 478 (1995)), providing a quantitative explanation of the spectra. | |
| dc.description | 18 pages, 11 figures | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0405009 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0405009 | |
| dc.identifier | J. Phys. Soc. Jpn. 73, 3171-3176(2004) | |
| dc.identifier | doi:10.1143/JPSJ.73.3171 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/100121 | |
| dc.subject | Materials Science | |
| dc.title | Anisotropy of Resonant Inelastic X-Ray Scattering at the K Edge of Si:Theoretical Analysis | |
| dc.type | text |