Measurement of Coulomb drag between Anderson insulators

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We report observations of the Coulomb drag effect between two effectively 2-d insulating a-Si_{1-x}Nb_{x} films. We find that there only exist a limited range of experimental parameters over which we can measure a sizable linear-response transresistivity (ρ_{d}). The temperature dependence of ρ_{d} is consistent with the layers being Efros-Shklovskii Anderson insulators provided that a 3-d density of states and a localization length smaller than that obtained from the DC layer-conductivity are assumed.
4 pages, 4 figures

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Mesoscale and Nanoscale Physics, Disordered Systems and Neural Networks

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http://salesiana.dossiersoluciones.com/handle/123456789/155793

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/0802.4073
 http://arxiv.org/abs/0802.4073

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arXiv