Modelling Thickness-Dependence of Ferroelectric Thin Film Properties

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We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.
13 pages, 17 figures

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/139360

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/0704.2752
 http://arxiv.org/abs/0704.2752
 PRB 76, 014112 (2007)
 doi:10.1103/PhysRevB.76.014112

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arXiv