Modelling Thickness-Dependence of Ferroelectric Thin Film Properties

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dc.creatorPalova, L.
dc.creatorChandra, P.
dc.creatorRabe, K. M.
dc.date2007-04-20
dc.date2007-10-07
dc.date.accessioned2026-07-07T08:34:13Z
dc.date.available2026-07-07T08:34:13Z
dc.descriptionWe present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.
dc.description13 pages, 17 figures
dc.identifierhttps://arxiv.org/abs/0704.2752
dc.identifierhttp://arxiv.org/abs/0704.2752
dc.identifierPRB 76, 014112 (2007)
dc.identifierdoi:10.1103/PhysRevB.76.014112
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/139360
dc.subjectMaterials Science
dc.titleModelling Thickness-Dependence of Ferroelectric Thin Film Properties
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