Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics

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Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
Contribution for Proceedings of EMF 2003 (Cambridge, UK)

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/22363

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/cond-mat/0310074
 http://arxiv.org/abs/cond-mat/0310074

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arXiv