Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics

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dc.creatorChandra, P.
dc.creatorDawber, M.
dc.creatorLittlewood, P. B.
dc.creatorScott, J. F.
dc.date2003-10-03
dc.date.accessioned2026-07-07T02:53:57Z
dc.date.available2026-07-07T02:53:57Z
dc.descriptionMotivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
dc.descriptionContribution for Proceedings of EMF 2003 (Cambridge, UK)
dc.identifierhttps://arxiv.org/abs/cond-mat/0310074
dc.identifierhttp://arxiv.org/abs/cond-mat/0310074
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22363
dc.subjectMaterials Science
dc.titleScaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics
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